VLSI SoC Design: Concepts, Perspective & Implementation
why coverage is more in stuck at than transition fault ?
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Stuck at fault testing will generate dominant Combinatoric ATPG patterns whereas transition fault testing will be more of sequential type ATPG when you use two capture pulses.
Hi Vinay, you mean transition fault uses LOC approach so we won't have more coverage in transition fault? Now a days ATPG also uses LOC approach right
why coverage is more in stuck at than transition fault ?
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DeleteStuck at fault testing will generate dominant Combinatoric ATPG patterns whereas transition fault testing will be more of sequential type ATPG when you use two capture pulses.
DeleteHi Vinay, you mean transition fault uses LOC approach so we won't have more coverage in transition fault? Now a days ATPG also uses LOC approach right
Delete